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    • QUART SP_digi - DR/CR R+F QA Test Phantom

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    QUART SP_digi - DR/CR R+F QA Test Phantom

    QUART SP_digi - DR/CR R+F QA Test Phantom

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    The QUART SP_digi phantom is designed to be used for QA/QC in radiography and fluoroscopy at x-ray equipment.
    Featuring digital storage screen (CR) or CCD image detectors (DR).

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      SKU:
      RG1171
      Brand: Quart

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      The QUART SP_digi phantom is designed to be used for QA/QC in radiography and fluoroscopy at x-ray equipment 
      featuring digital storage screen (CR) or CCD image detectors (DR).

      The phantom does not feature planar grid structures, thus clearly revealing disturbing artefacts.

      QUART SP_digi complies with DIN 6868-13, DIN 6868-58 as well as IEC 61223-3-1 and IEC 61223-2-11.


      Technical specifications

      • ENHANCED PHANTOM FORMAT: 330 x 330 cm
      • DESIGN APPROACH: Simplified design for precise artefact detection
      • DYNAMIC STEP WEDGE: 7 Steps; thickness 0 – 2.3 mm
      • SIGNAL NORMALISATION: Homogeneous area in the phantom center, 10 x 10 cm
      • HIGH-CONTRAST RESOLUTION: Line Pair Bar Pattern (Type 38 / Pb 0.05 mm / 45°)
      • LOW-CONTRAST RESOLUTION: 6 Test objects (Aluminium discs; 0.1 – 0.7 mm)
      • X-RAY FIELD ALIGNMENT: Field size markings for all major fields-of-view
      • CENTER: cross-marker, also visible when QUART ZTB beam alignment tool is in use 
      • VERTICAL POSITIONING: Wire mount system available for tests of wall-mounted units.
      • SIZE: 330 x 330 x 10 mm (L x W x H)
      Parameters
      • Spatial Resolution
      • Low-Contrast Resolution
      • Radiation Field Alignment
      • Image Homogeneity
      • Signal Normalisation
      • Artefacts, Image Flaws, etc.
      • Dose Indicator









      The QUART SP_digi phantom is designed to be used for QA/QC in radiography and fluoroscopy at x-ray equipment 
      featuring digital storage screen (CR) or CCD image detectors (DR).

      The phantom does not feature planar grid structures, thus clearly revealing disturbing artefacts.

      QUART SP_digi complies with DIN 6868-13, DIN 6868-58 as well as IEC 61223-3-1 and IEC 61223-2-11.


      Technical specifications

      • ENHANCED PHANTOM FORMAT: 330 x 330 cm
      • DESIGN APPROACH: Simplified design for precise artefact detection
      • DYNAMIC STEP WEDGE: 7 Steps; thickness 0 – 2.3 mm
      • SIGNAL NORMALISATION: Homogeneous area in the phantom center, 10 x 10 cm
      • HIGH-CONTRAST RESOLUTION: Line Pair Bar Pattern (Type 38 / Pb 0.05 mm / 45°)
      • LOW-CONTRAST RESOLUTION: 6 Test objects (Aluminium discs; 0.1 – 0.7 mm)
      • X-RAY FIELD ALIGNMENT: Field size markings for all major fields-of-view
      • CENTER: cross-marker, also visible when QUART ZTB beam alignment tool is in use 
      • VERTICAL POSITIONING: Wire mount system available for tests of wall-mounted units.
      • SIZE: 330 x 330 x 10 mm (L x W x H)
      Parameters
      • Spatial Resolution
      • Low-Contrast Resolution
      • Radiation Field Alignment
      • Image Homogeneity
      • Signal Normalisation
      • Artefacts, Image Flaws, etc.
      • Dose Indicator









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